Dielectrical Properties of CeO2 Nanoparticles at Different Temperatures

Диэлектрические свойства наночастиц CeO2 при различных температурах
Reza Zamiri, Hossein Abbastabar Ahangar, Ajay Kaushal, Azmi Zakaria, Golnoosh Zamiri, David Maria Tobaldi, J.M.F. Ferreira
2015-04-24

CeO2 nanoparticlescrystalline domain sizedielectric lossdielectric propertieswhole powder pattern modelling
A template-free precipitation method was used as a simple and low cost method for preparation of CeO2 nanoparticles. The structure and morphology of the prepared nanoparticle samples were studied in detail using X-ray diffraction, Raman spectroscopy and Scanning Electron Microscopy (SEM) measurements. The whole powder pattern modelling (WPPM) method was applied on XRD data to accurately measure the crystalline domain size and their size distribution. The average crystalline domain diameter was found to be 5.2 nm, with a very narrow size distribution. UV-visible absorbance spectrum was used to calculate the optical energy band gap of the prepared CeO2 nanoparticles. The FT-IR spectrum of prepared CeO2 nanoparticles showed absorption bands at 400 cm(-1) to 450 cm(-1) regime, which correspond to CeO2 stretching vibration. The dielectric constant (εr) and dielectric loss (tan δ) values of sintered CeO2 compact consolidated from prepared nanoparticles were measured at different temperatures in the range from 298 K (room temperature) to 623 K, and at different frequencies from 1 kHz to 1 MHz.
1
CeO2 nanoparticles were synthesized using a simple, low-cost, template-free precipitation method.
2
Structural and morphological characterization employed X-ray diffraction, Raman spectroscopy, scanning electron microscopy, UV-visible absorption, and FT-IR spectroscopy.
3
The dielectric constant and dielectric loss of sintered CeO2 compacts were measured across 298–623 K and 1 kHz–1 MHz.
4
UV-visible absorption was used to determine the optical band gap, while FT-IR identified CeO2 stretching vibrations between 400 and 450 cm−1.
5
Whole powder pattern modelling of X-ray diffraction data measured an average crystalline domain diameter of 5.2 nm with a very narrow size distribution.

Sintered CeO2 compact consolidated from template-free-precipitated CeO2 nanoparticles

Temperature- and frequency-dependent dielectric constant (εr) and dielectric loss (tan δ) from 298 K to 623 K and from 1 kHz to 1 MHz

Publication Details
Publication Date
2015-04-24
Journal
Publisher
ISSN
Access Type
Author Information
Authors
Reza Zamiri
Hossein Abbastabar Ahangar
Ajay Kaushal
Azmi Zakaria
Golnoosh Zamiri
David Maria Tobaldi
J.M.F. Ferreira
Explore further
Open the scid.ai AI chat with a ready-made request: it will find papers on a similar topic and help build a literature review.
Find similar papers in the chat
Make a presentation
100%