Potential-induced degradation in photovoltaic modules: a critical review

Деградация под действием потенциала в фотоэлектрических модулях: критический обзор
Wei Luo, Yong Sheng Khoo, Peter Hacke, Volker Naumann, Dominik Lausch, Steven P. Harvey, Jai Prakash Singh, Jing Chai, Yan Wang, Armin G. Aberle, Seeram Ramakrishna
2016-11-21
SCID:  54.1/5r8ckq3b Discuss with AI
PID-related issuescritical reviewphotovoltaic modulespotential-induced degradation
Abstract (AI)
This paper presents a critical review on potential-induced degradation (PID) in photovoltaic modules to illustrate the current research status and potential research paths to address PID-related issues.
Key Findings
1
It identifies potential research paths for addressing and mitigating PID-related problems.
2
It summarizes the research status of PID-related issues in photovoltaic modules.
3
The abstract does not report specific experimental results, quantitative comparisons, or performance metrics.
4
The paper critically reviews current research on potential-induced degradation (PID) in photovoltaic modules.
Research Object

potential-induced degradation in photovoltaic modules

Research Subject

current research status and potential research paths for addressing PID-related issues

Publication Details
Publication Date
2016-11-21
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Authors
Wei Luo
Yong Sheng Khoo
Peter Hacke
Volker Naumann
Dominik Lausch
Steven P. Harvey
Jai Prakash Singh
Jing Chai
Yan Wang
Armin G. Aberle
Seeram Ramakrishna
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