Review of Models and the Disturbed State Concept for Thermomechanical Analysis in Electronic Packaging
Обзор моделей и концепции возмущённого состояния для термомеханического анализа в электронной упаковке
2000-06-30
SCID: 54.1/92kdw9jc
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constitutive modelingdisturbed state conceptfatigue failurefinite elementthermomechanical stress analysis
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Abstract (AI)
A number of models for thermomechanical stress analysis and fatigue failure of materials are reviewed and their capabilities and limitations are identified. The unified disturbed state concept (DSC) for constitutive modeling of materials and interfaces is presented and compared with other approaches. An approximate procedure based on the DSC is proposed for accelerated design-analysis and cyclic fatigue failure. Solutions of example problems using the DSC and associated computer (FE) procedures are included to illustrate its integrated and improved capabilities for analysis of stresses, strains, microcracking, fracture and fatigue failure, and reliability.
Key Findings
1
An approximate DSC-based procedure is proposed to enable accelerated design-analysis and prediction of cyclic fatigue failure.
2
Finite-element solutions and example problems demonstrate DSC's integrated capabilities for analyzing stresses, strains, microcracking, fracture, fatigue failure, and reliability.
3
Multiple existing models for thermomechanical stress analysis and material fatigue are reviewed, with their capabilities and limitations identified.
4
The disturbed state concept (DSC) is presented as a unified constitutive modeling framework for materials and interfaces, and compared to other approaches.
Research Object
Materials and interfaces in electronic packaging subjected to thermomechanical stress and fatigue
Research Subject
Evaluation and modeling of thermomechanical stresses, strains, microcracking, fracture, fatigue failure and reliability using the disturbed state concept (DSC) and related computational (FE) procedures for design-analysis and accelerated cyclic fatigue prediction
Publication Details
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2000-06-30
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