Physical characterization and performance evaluation of an x-ray micro-computed tomography system for dimensional metrology applications

Физическая характеристика и оценка производительности системы рентгеновской микро-компьютерной томографии для задач размерного метрологического контроля
Leonhard Reindl, Jochen Hiller, Michael Maisl
2012-06-14

dimensional metrologymicro-CTperformance evaluationphysical characterizationx-ray micro-computed tomography
Art. 085404, 18 S.
1
Characterization and evaluation results are intended to inform suitability of the micro-CT system for precision dimensional metrology.
2
The paper presents a physical characterization of an x-ray micro-computed tomography (micro-CT) system aimed at dimensional metrology applications.
3
The study includes a performance evaluation of the micro-CT system specific to dimensional measurement tasks.

X-ray micro-computed tomography (micro-CT) system used for dimensional metrology

Physical characterization and performance evaluation of the micro-CT system for dimensional metrology applications

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2012-06-14
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Authors
Leonhard Reindl
Jochen Hiller
Michael Maisl
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