Carbon Nanotube Vias Fabricated by Remote Plasma-Enhanced Chemical Vapor Deposition
Переходные отверстия из углеродных нанотрубок, изготовленные методом химического осаждения из паровой фазы с дистанционным плазменным возбуждением
2008-04-01
SCID: 54.1/bbk36xna
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carbon nanotube viaschemical mechanical polishingmultiwalled carbon nanotubesremote plasma-enhanced chemical vapor depositionvia resistance
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Abstract (AI)
Multiwalled carbon nanotubes (CNTs) have been grown by remote plasma-enhanced chemical vapor deposition at temperatures as low as 400 °C. In via formation, the selective growth of CNT bundles in via holes at 430 °C and chemical mechanical polishing for planarization have been performed. The electrical evaluation of CNT single vias with various diameters reveals that the via resistance is inversely proportional to the via area. This result indicates that the CNTs are grown with uniform quality and density in the via holes with various diameters and stable contact formations are obtained. Moreover, the resistances of single vias are approximately equivalent to the via resistances estimated from the resistances of via chains, demonstrating the via-to-via uniformity of the CNT vias obtained by the remote plasma-enhanced chemical vapor deposition.
Key Findings
1
Multiwalled carbon nanotubes were grown by remote plasma-enhanced chemical vapor deposition at temperatures as low as 400 °C.
2
Selective growth of CNT bundles inside via holes was achieved at 430 °C, followed by chemical mechanical polishing for planarization.
3
Single-via resistance was inversely proportional to via area, indicating uniform CNT quality and density across different via diameters.
4
Single-via resistances approximately matched resistances estimated from via chains, demonstrating good via-to-via uniformity and stable contact formation.
Research Object
Multiwalled carbon nanotube vias fabricated by remote plasma-enhanced chemical vapor deposition
Research Subject
Electrical resistance, uniformity, and contact stability of CNT vias as functions of via diameter and area
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2008-04-01
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