IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data

Стандартный язык интерфейса тестирования IEEE (STIL) для данных цифровых тестовых векторов
1999-03-18

Standard Test Interface Languageautomated test equipmentdigital test vector datastructured teststest description language
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of digital test vector data from CAE to ATE environments; (b) specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a DUT; and (c) supports the volume of test vector data generated from structured tests.
1
STIL defines a standardized interface between digital test-generation tools and automatic test equipment.
2
STIL specifies pattern, format, and timing information sufficient to apply digital test vectors to a device under test.
3
The language facilitates transferring digital test-vector data from computer-aided engineering environments to automatic test-equipment environments.
4
The language supports the large volumes of test-vector data produced by structured testing.

Standard Test Interface Language (STIL) for digital test vector data

Specification and transfer of digital test-vector patterns, formats, timing, and volume between CAE test-generation tools and ATE equipment for application to a DUT

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1999-03-18
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