The influence of the measurement environment on the accuracy of the extraction of the physical parameters of solar cells

Влияние условий измерений на точность определения физических параметров солнечных элементов
Ralph Gottschalg, Mathias Rommel, David Infield, M.J. Kearney
1999-08-12

Marquardt-Levenberg algorithmcurrent-voltage characteristicleast squares error criterionmeasurement environmentsolar cell parameter extraction
This article concerns the influence of measurement conditions on the extraction of a solar cell's equivalent circuit parameters. Influences previously not investigated are considered, thus helping to define suitable measurement strategies. The influences of measurement environments are investigated, as is the influence of the fitting algorithm chosen. It is shown that the number of measurement points for the current-voltage characteristic can have an important effect on the accuracy of the parameters extracted. The stability of the system is of minor importance, as long as the variations in the measurement conditions are monitored. We also show that the Marquardt-Levenberg algorithm using a least squares error criterion and a hybrid algorithm employing an area criterion outperform other choices of fitting algorithm.
1
Measurement environment conditions significantly influence the accuracy of extracted solar-cell equivalent-circuit parameters.
2
System stability is of minor importance when variations in measurement conditions are monitored.
3
The Marquardt-Levenberg algorithm with a least-squares criterion and a hybrid area-criterion algorithm outperform other tested fitting algorithms.
4
The number of current-voltage measurement points can strongly affect the accuracy of parameter extraction.
5
The study identifies measurement and fitting strategies that improve reliable extraction of solar-cell physical parameters.

Solar cell equivalent-circuit parameter extraction under varying measurement environments

Effects of measurement conditions, current–voltage measurement-point density, system stability, and fitting-algorithm choice on the accuracy of extracted physical parameters

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Publication Date
1999-08-12
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Authors
Ralph Gottschalg
Mathias Rommel
David Infield
M.J. Kearney
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