Visual-Based Defect Detection and Classification Approaches for Industrial Applications—A SURVEY

Подходы к выявлению и классификации дефектов на основе визуального контроля для промышленных применений — ОБЗОР
Paolo Dario, Calogero Maria Oddo, Mario Milazzo, Tamás Czimmermann, Gastone Ciuti, Marcello Chiurazzi, Stefano Roccella
2020-03-06

deep learningdefect taxonomy (visible vs palpable)supervised and unsupervised classifierstextural defect detectionvisual-based defect detection
This paper reviews automated visual-based defect detection approaches applicable to various materials, such as metals, ceramics and textiles. In the first part of the paper, we present a general taxonomy of the different defects that fall in two classes: visible (e.g., scratches, shape error, etc.) and palpable (e.g., crack, bump, etc.) defects. Then, we describe artificial visual processing techniques that are aimed at understanding of the captured scenery in a mathematical/logical way. We continue with a survey of textural defect detection based on statistical, structural and other approaches. Finally, we report the state of the art for approaching the detection and classification of defects through supervised and non-supervised classifiers and deep learning.
1
Focuses applicability of automated visual-based defect detection across materials including metals, ceramics, and textiles.
2
Provides a general taxonomy dividing defects into two classes: visible (e.g., scratches, shape error) and palpable (e.g., crack, bump).
3
Reports the state of the art in defect detection and classification using supervised, unsupervised classifiers and deep learning.
4
Reviews textural defect detection methods categorized as statistical, structural, and other approaches.
5
Surveys artificial visual processing techniques for mathematically/logically understanding captured scenes for defect detection.

Automated visual-based defect detection systems for industrial materials (metals, ceramics, textiles)

Detection and classification of visible and palpable defects using visual processing techniques, texture analysis, supervised/unsupervised classifiers and deep learning

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Publication Date
2020-03-06
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Authors
Paolo Dario
Calogero Maria Oddo
Mario Milazzo
Tamás Czimmermann
Gastone Ciuti
Marcello Chiurazzi
Stefano Roccella
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