Grid Circle Analyzer - Computer Aided Measurement of Deformation
Grid Circle Analyzer — компьютерная система для измерения деформации
1979-02-01
SCID: 54.1/ppeu72nf
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ellipse fittinggrid circle methodsheet metal stampingsolid state camerastrain measurement
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Abstract (AI)
<div class="htmlview paragraph">The grid circle method of measuring strain in a sheet metal stamping is necessary for understanding formability. However, this method has primarily been limited to use as a research tool because of the slow, tedious measurements required to measure strain from each deformed circle. An automatic method of measuring strains has been developed which combines a solid state camera with a minicomputer to calculate a best fit ellipse through each deformed circle. The computer calculates and prints the major and minor strain. The accuracy of this automatic system is comparable to measurements made from a toolmaker's microscope and is ∼3 times faster. Furthermore, it is not necessary to first section large stampings to read strains. These advantages give this new method the ability to rapidly read strains at the press shop to aid in implementing technological advances.</div>
Key Findings
1
Accuracy of the automatic system is comparable to measurements from a toolmaker's microscope.
2
An automatic method combining a solid state camera and a minicomputer computes best-fit ellipses through deformed grid circles to measure strain.
3
Large stampings no longer need to be sectioned prior to strain reading, enabling rapid strain measurement on the press shop.
4
The automatic method is approximately three times faster than the manual microscope-based measurements.
5
The system calculates and prints major and minor strains for each deformed circle.
Research Object
Grid circle method for measuring strain in sheet metal stampings (automatic computer-aided grid circle analyzer employing camera and minicomputer to fit ellipses)
Research Subject
Automated measurement of major and minor strains from deformed grid circles (accuracy, speed, and applicability without sectioning using best-fit ellipse computation)
Author Information
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