An improved EEHEMT model for kink effect on AlGaN/GaN HEMT
Усовершенствованная модель EEHEMT для учета эффекта излома в HEMT на основе AlGaN/GaN
2014-07-31
SCID: 54.1/s27t27g9
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AlGaN/GaN HEMTEEHEMT modelRF large-signal characteristicshyperbolic tangent functionkink effect
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Abstract (AI)
In this paper, a new current expression based on both the direct currect (DC) characteristics of the AlGaN/GaN high election mobility transistor (HEMT) and the hyperbolic tangent function tanh is proposed, by which we can describe the kink effect of the AlGaN/GaN HEMT well. Then, an improved EEHEMT model including the proposed current expression is presented. The simulated and measured results of I–V , S -parameter, and radio frequency (RF) large-signal characteristics are compared for a self-developed on-wafer AlGaN/GaN HEMT with ten gate fingers each being 0.4-μm long and 125-μm wide (Such an AlGaN/GaN HEMT is denoted as AlGaN/GaN HEMT (10 × 125 μm)). The improved large signal model simulates the I–V characteristic much more accurately than the original one, and its transconductance and RF characteristics are also in excellent agreement with the measured data.
Key Findings
1
A new drain-current expression combining measured DC characteristics with a hyperbolic tangent function accurately describes the kink effect in AlGaN/GaN HEMTs.
2
For a self-developed 10 × 125 μm AlGaN/GaN HEMT, the improved model reproduces measured I–V characteristics more accurately than the original model.
3
The improved model’s transconductance, S-parameters, and RF large-signal characteristics show excellent agreement with measured data.
4
The proposed current expression is incorporated into an improved EEHEMT large-signal model for AlGaN/GaN transistor simulation.
Research Object
on-wafer AlGaN/GaN high-electron-mobility transistor (HEMT) with ten 0.4-μm-long, 125-μm-wide gate fingers
Research Subject
kink effect and the accuracy of DC I–V, transconductance, S-parameter, and RF large-signal characteristics modeling
Publication Details
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2014-07-31
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