On surface Raman scattering and luminescence radiation in boron carbide

О поверхностном рассеянии Рамана и люминесцентном излучении в карбиде бора
T. Tanaka, H. Werheit, В. Б. Филипов, Ulrich Schwarz, Marc Armbrüster, A. Leithe‐Jasper, Sulkhan Shalamberidze
2010-01-05

boron carbidebulk phononsfundamental absorption edge (2.09 eV)luminescence radiationsurface Raman scattering
The discrepancy between Raman spectra of boron carbide obtained by Fourier transform Raman and conventional Raman spectrometry is systematically investigated. While at photon energies below the exciton energy (1.560 eV), Raman scattering of bulk phonons of boron carbide occurs, photon energies exceeding the fundamental absorption edge (2.09 eV) evoke additional patterns, which may essentially be attributed to luminescence or to the excitation of Raman-active processes in the surface region. The reason for this is the very high fundamental absorption in boron carbide inducing a very small penetration depth of the exciting laser radiation. Raman excitations essentially restricted to the boron carbide surface region yield spectra which considerably differ from bulk phonon ones, thus indicating structural modifications.
1
For photon energies below the exciton energy (1.560 eV), Raman scattering probes bulk phonons of boron carbide.
2
High fundamental absorption in boron carbide causes very small laser penetration depth, restricting Raman excitation to the surface region at higher photon energies.
3
Photon energies above the fundamental absorption edge (2.09 eV) produce additional spectral features attributed to luminescence or surface-localized Raman-active processes.
4
Raman spectra of boron carbide differ systematically between Fourier transform Raman and conventional Raman measurements.
5
Surface-restricted Raman spectra differ considerably from bulk phonon spectra, indicating structural modifications in the boron carbide surface region.

Boron carbide (bulk and surface regions)

Differences between bulk phonon Raman scattering and additional surface-related Raman/luminescence radiation as a function of excitation photon energy and penetration depth, indicating surface structural modifications

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2010-01-05
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Authors
T. Tanaka
H. Werheit
В. Б. Филипов
Ulrich Schwarz
Marc Armbrüster
A. Leithe‐Jasper
Sulkhan Shalamberidze
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