Advanced Characterization Techniques for Thin Film Solar Cells

Передовые методы характеризации тонкоплёночных солнечных элементов
2016-07-22
SCID:  54.1/veebbbt6 Discuss with AI
capacitance spectroscopyelectroluminescence analysisphotoluminescence analysisthin-film photovoltaicsthin-film solar cell characterization
Abstract (AI)
I Introduction 1. Introduction to thin-film photovoltaics II Device characterization 2. Fundamental electrical characterization of thin-film solar cells 3. Electroluminescence analysis of thin-film solar modules 4. Capacitance spectroscopy of thin-film solar cells III Materials characterization 5. Characterizing the light trapping properties of textured surfaces with scanning near-field optical microscopy 6. Ellipsometry 7. Photoluminescence analysis of Si and chalcopyrite-type thin films for solar cells 8. Steady state photocarrier grating method 9. Time-of-flight analysis 10. Electron Spin Resonance on Si thin films for solar cells 11. Scanning probe microscopy on thin films for solar cells 12. Electron microscopy on thin films for solar cells 13. X-ray and neutron diffraction of materials for thin film solar cells 14. Raman Spectroscopy on thin films for solar cells 15. Soft x-ray and electron spectroscopy: a unique tool chest to characterize the chemical and electronic properties of surfaces and interfaces 16. Elemental distribution profiling of thin films for solar cells 17. Hydrogen effusion experiments IV Materials and device modelling 18. Ab-initio modelling of semiconductors 19. One-dimensional electro-optical simulations of thin film solar cells 20. Two-dimensional electrical simulations of thin film solar cells
Key Findings
1
Ab-initio, one-dimensional electro-optical, and two-dimensional electrical modelling are presented as tools for interpreting materials and device behavior.
2
Advanced optical and structural methods address light trapping, carrier dynamics, defects, morphology, composition, interfaces, and crystallographic properties.
3
Electrical device characterization includes fundamental measurements, electroluminescence analysis, and capacitance spectroscopy for assessing thin-film solar-cell performance.
4
The paper presents a comprehensive framework for characterizing thin-film solar cells at both device and materials levels.
5
The reviewed techniques include photoluminescence, scanning probe and electron microscopy, Raman spectroscopy, diffraction, spectroscopy, and elemental profiling.
Research Object

thin-film solar cells and their constituent semiconductor thin films, surfaces, interfaces, and modules

Research Subject

their electrical, optical, structural, chemical, electronic, and materials properties, as well as device behavior and modeling characteristics

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2016-07-22
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