Kink Effect in ${\rm S}_{22}$ for GaN and GaAs HEMTs
Эффект излома в S22 для HEMT на основе GaN и GaAs
2015-03-31
SCID: 54.1/wmzy6eju
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GaAs HEMTsGaN HEMTsIntrinsic transconductanceKink effectS22 scattering parameter
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Abstract (AI)
This letter provides a clear understanding of the kink effect in S22for active solid-state electronic devices. The origin of the kink effect is ascribed to the intrinsic section of the transistor, whereas the extrinsic elements determine its shape at the extrinsic ports. Therefore, to fairly compare the kink effect for GaN and GaAs HEMTs, the present analysis is not only focused on the whole devices but also on their intrinsic sections. The experimental evidence shows that, independently of the specific semiconductor technology, the size and the frequency band of the kink effect are mainly due to the values of the intrinsic transconductance and capacitances, respectively.
Key Findings
1
Across semiconductor technologies, kink-effect size is mainly governed by the intrinsic transconductance value.
2
Fair comparison of the kink effect between GaN and GaAs HEMTs requires analyzing both complete devices and their intrinsic sections.
3
The kink effect in S22 originates in the transistor’s intrinsic section, while extrinsic elements determine its shape at external ports.
4
The kink-effect frequency band is primarily determined by the intrinsic capacitance values.
Research Object
GaN and GaAs HEMTs, including their intrinsic transistor sections and extrinsic ports
Research Subject
The origin, shape, size, and frequency-band dependence of the kink effect in S22, in relation to intrinsic transconductance and capacitances and extrinsic elements
Publication Details
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2015-03-31
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