Comparative study of single event upset susceptibility in the Complementary FET (CFET) and FinFET based 6T-SRAM

Zhengxin Zhang, Wangyong Chen, Jianwen Lin, Linlin Cai
2024-11-25
SCID:  54.1/yskabgee
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2024-11-25
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Zhengxin Zhang
Wangyong Chen
Jianwen Lin
Linlin Cai
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