Nanoindentation and contact-mode imaging at high temperatures
Christopher A. Schuh, Corinne E. Packard, Alan C. Lund
2006-03-01
SCID:
54.1/yva84nyv
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DOI
10.1557/jmr.2006.0080
Publication Date
2006-03-01
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Authors
Christopher A. Schuh
Corinne E. Packard
Alan C. Lund
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