Failure analysis and reliability evaluation of silver-sintered die attachment for high-temperature applications

Y. Zhou, Hongqiang Zhang, Guisheng Zou, Lei Liu, Zhenyu Zhao, Wengan Wang, Gong Zhang
2019-02-21
SCID:  54.1/yyutpzta
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2019-02-21
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Y. Zhou
Hongqiang Zhang
Guisheng Zou
Lei Liu
Zhenyu Zhao
Wengan Wang
Gong Zhang
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