Electrical characterization of SiC MOS capacitors: A critical review

Peyush Pande, Hamid Amini Moghadam, Philip Tanner, Jisheng Han, Sima Dimitrijev, Daniel Haasmann
2020-07-23
SCID:  54.1/zj63u7x4
Publication Details
Publication Date
2020-07-23
Journal
Publisher
ISSN
Access Type
Author Information
Authors
Peyush Pande
Hamid Amini Moghadam
Philip Tanner
Jisheng Han
Sima Dimitrijev
Daniel Haasmann
Explore More Research
Use the citation graph to discover related papers and expand your research horizons.
Click any node to explore →
Download PDF
100%