Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy

Stefan W. Hell, Jan Wichmann
1994-06-01

We propose a new type of scanning fluorescence microscope capable of resolving 35 nm in the far field. We overcome the diffraction resolution limit by employing stimulated emission to inhibit the fluorescence process in the outer regions of the excitation point-spread function. In contrast to near-field scanning optical microscopy, this method can produce three-dimensional images of translucent specimens.
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1994-06-01
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Stefan W. Hell
Jan Wichmann
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