Wide Bandgap Semiconductors for Power Electronics: Comparative Properties, Applications, and Reliability of GaN and SiC Devices
Широкозонные полупроводники для силовой электроники: сравнительные свойства, применения и надежность приборов на основе GaN и SiC
2026-03-18
SCID: 54.1/bc992ba3
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gallium nitride (GaN)power electronicssilicon carbide (SiC)thermal boundary resistancewide bandgap semiconductors
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Abstract (AI)
Wide bandgap (WBG) semiconductors such as gallium nitride (GaN) and silicon carbide (SiC) have revolutionized modern power electronics by enabling devices that operate at higher voltages, temperatures, and switching frequencies than their silicon counterparts. This paper reviews the material properties, device architectures, fabrication techniques, and thermal management strategies that underpin the performance of GaN and SiC technologies. We highlight key trade-offs between GaN and SiC in terms of voltage blocking capability, switching efficiency, and thermal robustness and discussed their application in electric vehicles, renewable energy systems, and power converters. Market adoption trends and manufacturing challenges are also analyzed, with attention to cost-performance dynamics and packaging innovations. Finally, we address the critical role of thermal boundary resistance and emerging reliability solutions, providing a perspective on the future trajectory of WBG device research and commercialization.
Key Findings
1
Commercialization depends on manufacturing challenges, cost-performance trade-offs, market adoption, packaging innovations, and emerging reliability solutions.
2
GaN and SiC are applied in electric vehicles, renewable-energy systems, and power converters, supporting broader power-electronics applications.
3
GaN and SiC enable power devices to operate at higher voltages, temperatures, and switching frequencies than silicon devices.
4
The technologies involve trade-offs among voltage-blocking capability, switching efficiency, and thermal robustness, with distinct performance advantages for GaN and SiC.
5
Thermal management, particularly thermal boundary resistance, is identified as critical to device performance and reliability.
Research Object
GaN and SiC wide-bandgap semiconductor power devices
Research Subject
Comparative material, electrical, thermal, application, manufacturing, and reliability properties of GaN and SiC devices
Publication Details
Publication Date
2026-03-18
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References available in scid.ai4
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P-Type Conduction in Mg-Doped GaN Treated with Low-Energy Electron Beam Irradiation (LEEBI)1989